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Títol:
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Microwave noise parameter measurements of a high temperature superconducting flux flow transistor
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Autor/a:
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O'Callaghan Castellà, Juan Manuel; Martens, J. S.; Thompson, J. H.; Beyer, J. B.; Nordman, J. E.
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Altres autors:
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Universitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions; Universitat Politècnica de Catalunya. RF&MW - Grup de Recerca de sistemes, dispositius i materials de RF i microones |
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Abstract:
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The noise parameters of a high-temperature superconducting (HTS) flux flow transistor made of TlBaCaCuO operating at 77 K and 3-5 GHz were experimentally determined. It is assumed that the dominant noise mechanism of the device, which is based on an array of weak links with a magnetic control line, is due to the statistical nature of flux nucleation and motion in the links. The noise parameters dictate the dependence of the noise figure on the source impedance, and are calculated by measuring source impedances. Sensitivity analysis is used to estimate the accuracy of the measurements. The measurements indicate a minimum noise figure of less than 1 dB at 3 GHz. |
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Abstract:
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Peer Reviewed |
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Matèries:
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-Àrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica::Circuits de microones, radiofreqüència i ones mil·limètriques
-High temperature superconductors
-Microwave measurements
-barium compounds
-calcium compounds
-electric noise measurement
-electron device noise
-flux flow
-high-temperature superconductors
-microwave measurement
-superconducting junction devices
-thallium compounds
-Superconductors a altes temperatures
-Microones -- Mesurament |
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Drets:
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Tipus de document:
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Article |
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Publicat per:
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IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
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Compartir:
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