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Title:
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Measurement of on-wafer transistor noise parameters without a tuner using unrestricted noise sources
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Author:
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Lázaro Guillén, Antoni; Maya Sánchez, Mª del Carmen; Pradell i Cara, Lluís
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Other authors:
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Universitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions; Universitat Politècnica de Catalunya. RF&MW - Grup de Recerca de sistemes, dispositius i materials de RF i microones |
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Abstract:
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The authors present a method for calibrating the four noise parameters of a noise receiver which does not require a tuner The method permits using general (mismatched) noise sources, which may present very different source reflection coefficients between their hot and cold states. The method is applied to the calibration of a noise set-up using on-wafer noise sources (a reverse-biased cold-FET and an avalanche noise diode). Experimental validation of the receiver calibration and its application to the determination Of on-wafer FET noise parameters to 40 GHz is presented. |
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Abstract:
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Peer Reviewed |
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Subject(s):
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-Àrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica::Circuits de microones, radiofreqüència i ones mil·limètriques
-Field-effect transistors
-Microwave measurements
-Noise Measurement
-Calibration
-calibration
-integrated circuit noise
-microwave measurement
-receivers
-semiconductor device noise
-on-wafer transistor noise parameters
-noise receiver
-ismatched noise sources
-source reflection coefficients
-calibration
-noise set-up
-reverse-biased cold-FET
-avalanche noise diode
-40 GHz
-electric noise measurement
-Microones -- Mesurament |
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Rights:
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Document type:
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Article |
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Published by:
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HORIZON HOUSE PUBLICATIONS INC
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