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Title:
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A general approach for the calculation of intermodulation distortion in cavities with superconducting endplates
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Author:
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Mateu Mateu, Jordi; Collado Gómez, Juan Carlos; Menéndez Nadal, Óscar; O'Callaghan Castellà, Juan Manuel
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Other authors:
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Universitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions; Universitat Politècnica de Catalunya. RF&MW - Grup de Recerca de sistemes, dispositius i materials de RF i microones |
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Abstract:
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We report on a general procedure to calculate intermodulation distortion in cavities with superconducting endplates that is applicable to the dielectric-loaded cavities currently used for measurement of surface resistance in high-temperature superconductors. The procedure would enable the use such cavities for intermodulation characterization of unpatterned superconducting films, and would remove the uncertainty of measuring intermodulation on patterned devices, in which the effect of patterning damage might influence the outcome of the measurements. We have verified the calculation method by combining superconducting and copper endplates in a rutile-loaded cavity. |
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Abstract:
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Peer Reviewed |
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Subject(s):
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-Àrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica::Circuits de microones, radiofreqüència i ones mil·limètriques
-High temperature superconductors
-Microwaves
-Cavity resonators
-superconducting cavity resonators
-intermodulation distortion
-high-temperature superconductors
-surface resistance
-superconducting thin films
-cavities
-superconducting endplates
-dielectric-loaded cavities
-unpatterned superconducting films
-patterned devices
-patterning damage
-copper endplates
-rutile-loaded cavity
-microwave nonlinearities
-TiO2
-Cu
-Superconductors a altes temperatures
-Microones |
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Rights:
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Document type:
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Article |
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Published by:
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AMER INST PHYSICS
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Share:
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