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40% tunneling magnetoresistance after anneal at 380°C for tunnel junctions with iron¿oxide interface layers
Zhang, Zongzhi; Cardoso, Susana; Freitas, P. P.; Batlle Gelabert, Xavier; Wei, Peng; Barradas, N.; Soares, J. C.
Universitat de Barcelona
-Propietats magnètiques
-Circuits de transistors
-Electrònica de l'estat sòlid
-Transistor circuits
-Solid state electronics
Magnetic properties
(c) American Institute of Physics, 2001
Article
Article - Published version
American Institute of Physics
         

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