The hardness profile as a tool to detect spurious stationary points in the potential energy surface

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Título:	The hardness profile as a tool to detect spurious stationary points in the potential energy surface
Autor/a:	Torrent Sucarrat, Miquel; Luis Luis, Josep Maria; Duran i Portas, Miquel; Solà i Puig, Miquel
Abstract:	The energy and hardness profile for a series of inter and intramolecular conformational changes at several levels of calculation were computed. The hardness profiles were found to be calculated as the difference between the vertical ionization potential and electron affinity. The hardness profile shows the correct number of stationary points independently of the basis set and methodology used. It was found that the hardness profiles can be used to check the reliability of the energy profiles for those chemical system
Fecha de creación:	15-02-2011
Materia(s):	-Enllaços químics -Models matemàtics -Polarització (Electricitat) -Chemical bonds -Mathematical models -Polarization (Electricity)
Derechos:	Tots els drets reservats
Tipo de documento:	Artículo
Editor:	American Institute of Physics
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Torrent Sucarrat, Miquel; Duran i Portas, Miquel; Luis Luis, Josep Maria; Solà i Puig, Miquel

Torrent Sucarrat, Miquel; Luis Luis, Josep Maria; Duran i Portas, Miquel; Solà i Puig, Miquel

Torrent Sucarrat, Miquel; Luis Luis, Josep Maria; Duran i Portas, Miquel; Toro-Labbé, Alejandro; Solà i Puig, Miquel

Torrent Sucarrat, Miquel; Solà i Puig, Miquel; Duran i Portas, Miquel; Luis Luis, Josep Maria; Kirtman, Bernard

Torrent Sucarrat, Miquel; Solà i Puig, Miquel; Duran i Portas, Miquel; Luis Luis, Josep Maria; Kirtman, Bernard

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